Diagnostics and Reliability

Semestr: Winter

Range: 14+4s


Credits: 4

Programme type: Undefined

Study form: Parttime

Course language:


Fault models for digital systems, test generation for combinational and sequential circuits, test set minimization, fault simulation, signature analysis, built-in self-test, testing LSI and VLSI circuits, hardware for diagnostics. Introduction to reliability, models and characteristics, their evaluation, system redundancy, fault-tolerant systems.


Course syllabus:

1. Introduction to diagnostics, basic terms, fault models
2. Test generation for combination circuits
3. Test generation for sequential circuits
4. Test set minimization, random and pseudorandom test vectors
5. Automated test generation systems, fault simulation
6. Diagnostic data compression, signature analysis, fault dictionaries
7. Design for testability, built-in self-test equipment. Boundary scan
8. Fail-safe circuits, totally self-checking circuits. Watchdog
9. Testing LSI and VLSI: microprocessors, memories and PLDs
10. Test equipment
11. Introduction to reliability theory, reliability models
12. Evaluation and prediction of reliability characteristics
13. Use of static and dynamic redundancy on system level
14. Fault-tolerant systems, design and application

Seminar syllabus:

1. Faults in digital systems, fault models
2. Intuitive path sensitizing
3. Path sensitizing in circuits with redundancy, D-algorithm
4. Boolean difference, modular approach to test generation
5. Test generation for sequential circuits
6. Test set minimization
7. Diagnostic data compression, fault dictionaries
8. Fail-safe circuits. Preparing laboratory measurements
9. Laboratory measurements Fault detection and location in combinational circuits
10. Laboratory measurements Boundary scan
11. Laboratory measurements Built-in self-test equipment
12. Laboratory measurements Signature analysis
13. Computing of reliability characteristics, redundant systems
14. Markov models of repaired and non-repaired systems


1. M. Abramovici, M. A. Breuer, A. D. Friedman: Digital Systems
Testing and Testable Design. IEEE Computer Society New York
1990, 652 pp.