An Efficient Deterministic Test Pattern Compaction Scheme using Modified IC Scan Chain

Novák, O., Hlavička, J.

NOVÁK, O. and J. HLAVIČKA. An Efficient Deterministic Test Pattern Compaction Scheme using Modified IC Scan Chain. In: PRINETTO, P., et al., eds. ETW 2000 - IEEE European Test Workshop. ETW 2000, Cascais, 2000-05-23/2000-05-26. Lisboa: INESC-ID, 2000. p. 305-306.